The paper claims exceptional imaging performance based on the scintillator’s spatial resolution and light yield. However, the relationship between crystal uniformity and the reported resolution lacks detailed quantitative validation. For instance, Figure 5c illustrates X-ray imaging of a duplex-wire card, but no error analysis or reproducibility data is provided for the spatial resolution metric. Could the authors clarify whether multiple screen samples were tested under identical conditions to confirm consistency in performance? Furthermore, the impact of prolonged usage or potential degradation on the resolution was not discussed. Were such evaluations considered to assess the long-term reliability of the scintillation screens?
